Global Scanning Electron Microscope Market 2016-2020

走査型電子顕微鏡(SEM)の世界市場2016-2020

◆タイトル:Global Scanning Electron Microscope Market 2016-2020
◆商品コード:IRTNTR8993
◆調査・発行会社:Technavio (Infiniti Research Ltd.)
◆発行日:2016年4月14日
◆ページ数:54
◆資料形式:PDF / 英語
◆納品方法:Eメール(受注後24時間以内)
◆調査対象地域:グローバル
◆産業分野:産業装置
◆販売価格オプション(消費税別)
Single User(1名利用)USD2,500 ⇒換算¥282,500見積依頼/購入/質問フォーム
Five User(~5名利用)USD3,000 ⇒換算¥339,000見積依頼/購入/質問フォーム
Enterprise License(全社内共有可)USD4,000 ⇒換算¥452,000見積依頼/購入/質問フォーム
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【資料の概要】

当調査レポートでは、走査型電子顕微鏡(SEM)の世界市場について調査・分析し、エグゼクティブサマリー、市場概観、市場概観、業界の構造分析、走査型電子顕微鏡(SEM)の世界市場規模及び予測、需要先別分析、地域別分析/市場規模、市場の成長要因、市場の課題、市場動向、競争状況などの情報をお届けいたします。

About Scanning Electron Microscope
The capacity of an optical microscope is limited by the wavelength of the light used to see the object. When it comes to studying the structure and arrangement of atoms and molecules, optical microscopes fall short because their resolution is limited by the wavelength of light. In 1931, Max Knoll and Ernst Ruska invented the electron microscope. They used electrons to view objects through a microscope instead of optical light. As electrons have wavelengths that can be measured in angstroms, they are able to overcome the barriers of optical microscopes, thus proving highly beneficial for researchers viewing samples at the nanoscale.
SEMs produce images by examining the electrons scattered by the electron beam on the surface of a specimen. They are extensively used for R&D to analyze the surface of specimens. SEMs produce images by scattering electrons from the specimen surface, thus providing three-dimensional images. This is one of the distinguishing factors compared to TEMs and is an advantage for end-users. With 3D images, the user can get more information about the shape and features of the specimen, which are in many cases more important than the higher magnification provided by TEMs.

Technavio’s analysts forecast the global SEM market to grow at a CAGR of 7.65% during the period 2016-2020.

[Covered in this report]
The report covers the present scenario and the growth prospects of the global SEM market for 2016-2020. To calculate the market size, the report considers the sales of SEMs by each vendor across all regions. The ASP of SEMs is calculated by analyzing the selling prices of SEMs to end-users, which are then used to calculate the market size.

The market is divided into the following segments based on geography:
• Americas
• APAC
• EMEA

Technavio’s report, Global Scanning Electron Microscope Market 2016-2020, has been prepared based on an in-depth market analysis with inputs from industry experts. The report covers the market landscape and its growth prospects over the coming years. The report also includes a discussion of the key vendors operating in this market.

[Key vendors]
• Advantest Corp.
• Agilent Technologies
• B-nano Ltd.
• Carl Zeiss AG
• Delong America Inc.
• FEI Co.
• Hitachi High-Technologies Corp.
• JEOL Ltd.
• Pemtron Corp.
• Phenom-World BV
• Tescan

[Other prominent vendors]
• Advantest
• B-nano
• Delong America
• Keysight Technologies
• Phenom-World
• Pemtron
• TESCAN

[Market driver]
• Root-cause failure analysis
• For a full, detailed list, view our report

[Market challenge]
• High product cost
• For a full, detailed list, view our report

[Market trend]
• Increased adoption in automobile sector
• For a full, detailed list, view our report

[Key questions answered in this report]
• What will the market size be in 2020 and what will the growth rate be?
• What are the key market trends?
• What is driving this market?
• What are the challenges to market growth?
• Who are the key vendors in this market space?
• What are the market opportunities and threats faced by the key vendors?
• What are the strengths and weaknesses of the key vendors?

※You can request one free hour of our analyst’s time when you purchase this market report. Details are provided within the report.

【資料の目次】

PART 01: Executive summary
• Highlights

PART 02: Scope of the report
• Definitions
• Market size calculation
• Base year
• Geographical segmentation
• Vendor segmentation
• Top-vendor offerings

PART 03: Market research methodology
• Research methodology
• Economic indicators

PART 04: Introduction
• Key market highlights

PART 05: Market landscape
• Market overview
• Sample holders
• Wafer inspection equipment
• Market size and forecast
• Five forces analysis

PART 06: Market segmentation by end-user
• Semiconductors
• Life sciences
• Materials science
• Nanotechnology

PART 07: Geographical segmentation
• APAC
• Americas
• EMEA

PART 08: Market drivers
• Root-cause failure analysis
• Increased demand for FEG SEMs
• Growing nanotechnology research

PART 09: Impact of drivers

PART 10: Market challenges
• High product cost
• Long lead time
• Limitations of SEMs
• Long replacement cycles

PART 11: Impact of drivers and challenges

PART 12: Market trends
• Increased demand for low-voltage electron microscopes (LVEMs)
• Miniaturization of electronic devices
• Increased adoption in automobile sector

PART 13: Vendor landscape
• Competitive scenario
• Vendor analysis
• Other prominent vendors

PART 14: Appendix
• List of abbreviations

PART 15: Explore Technavio

[List of Exhibits]

Exhibit 01: Major economies included
Exhibit 02: Product offerings
Exhibit 03: Market overview of global SEM market 2015
Exhibit 04: SEMs in global electron microscope market by unit shipment 2015 (% share)
Exhibit 05: SEMs in global electron microscope market by revenue 2015 (% share)
Exhibit 06: Market size and forecast of sample holders for electron microscopes 2015-2020 ($ millions)
Exhibit 07: Market size and forecast by revenue 2015-2020 ($ millions)
Exhibit 08: Market size and forecast by unit shipment 2015-2020
Exhibit 09: ASP of SEMs 2015-2020 ($)
Exhibit 10: Five forces analysis
Exhibit 11: Market segmentation by end-user 2015-2020 (% share)
Exhibit 12: Market segmentation by end-user 2015-2020 (% share)
Exhibit 13: Global scanning electron microscopes market for semiconductors 2015-2020 ($ millions)
Exhibit 14: Global scanning electron microscopes market for life sciences 2015-2020 ($ millions)
Exhibit 15: Global scanning electron microscopes market for material sciences 2015-2020 ($ millions)
Exhibit 16: Global scanning electron microscopes market for life sciences 2015-2020 ($ millions)
Exhibit 17: Geographical segmentation of SEM market 2015-2020
Exhibit 18: Geographical segmentation of SEM market 2015-2020 ($ millions)
Exhibit 19: Scanning electron microscope market in APAC 2015-2020 ($ millions)
Exhibit 20: Scanning electron microscope market in Americas 2015-2020 ($ millions)
Exhibit 21: Scanning electron microscope market in EMEA 2015-2020 ($ millions)
Exhibit 22: Impact of drivers
Exhibit 23: Impact of drivers and challenges
Exhibit 24: Market share of vendors in terms of revenue and unit shipment 2015 (% share)
Exhibit 25: Revenue and unit shipment of SEM market by vendor 2015



【掲載企業】

Carl Zeiss, JEOL, FEI, Hitachi High-Technologies, Advantest, B-nano, Delong America, Keysight Technologies, Phenom-World, Pemtron, TESCAN.


【資料のキーワード】

走査型電子顕微鏡(SEM)

【調査方法】

一次資料による調査(業界専門家、ベンダー、代理店、顧客等を対象にしたデプスインタビュー調査など)及び二次資料による調査(Technavio独自のプラットフォーム、産業書籍、企業報告書、ニュース記事、アナリストレポート、貿易協会、政府機関発行データなど)

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