Global Thin Film Metrology Systems Market 2015-2019

薄膜計測装置の世界市場2015-2019

◆タイトル:Global Thin Film Metrology Systems Market 2015-2019
◆商品コード:IRTNTR5173
◆調査・発行会社:Technavio (Infiniti Research Ltd.)
◆発行日:2015年1月28日
◆ページ数:63
◆資料形式:pdf / 英語
◆納品方法:Eメール
◆調査対象地域:グローバル
◆産業分野:産業機器
◆販売価格オプション(消費税別)
Single UserUSD2,500 ⇒換算¥282,500見積依頼/購入/質問フォーム
Five UserUSD3,000 ⇒換算¥339,000見積依頼/購入/質問フォーム
Enterprise License(全社内共有可)USD4,000 ⇒換算¥452,000見積依頼/購入/質問フォーム
販売価格オプションの説明はこちらでご利用ガイドはこちらでご確認いただけます。
※お支払金額は「換算金額(日本円)+消費税+配送料(Eメール納品は無料)」です。
※Eメールによる納品の場合、通常ご注文当日~2日以内に納品致します。
※商品の納品後、納品日+5日以内に請求書を発行し、お客様宛に郵送いたしますので、請求書発行日より2ヶ月以内に銀行振込にて支払をお願いします。(振込先:三菱東京UFJ銀行/京橋支店/H&Iグローバルリサーチ株式会社)
※上記の日本語題名はH&Iグローバルリサーチが翻訳したものです。英語版原本には日本語表記はありません。
※為替レートは適宜修正・更新しております。リアルタイム更新ではありません。
※ご購入後、資料に記載の英語表現や単語の意味に関しましては無料でお答えいたします。(但し、対応範囲は弊社で判断)
※弊社H&Iグローバルリサーチ株式会社はTechnavio (Infiniti Research Ltd.)の日本における正規販売代理店です。

【資料の概要】

当調査レポートでは、薄膜計測装置の世界市場について調査・分析し、エグゼクティブサマリー、市場概観、業界の構造分析、薄膜計測装置の世界市場規模及び予測、市場シェア、地域別分析、購買基準、市場成長要因、市場の課題、市場動向、競争状況、主要企業(ベンダー)分析などの情報をお届けいたします。

About Thin-film Metrology Systems
Thin film metrology systems are used to measure the film thickness accurately. A series of film layers that act as a conductors, semiconductors, or bare wafers are deposited on an IC during IC fabrication. Thin film metrology systems are required during thin film deposition process to monitor and measure thin film parameters such as thickness, resistivity, and stress. There are various technologies used to measure the film thickness which include profilometry, ellipsometry, spectroscopic reflectrometry, and X-ray analysis.

TechNavio’s analysts forecast the Global Thin-film Metrology Systems market will grow at a CAGR of 3.4 percent over the period 2014-2019.

[Covered in this Report]
This report covers the present scenario and growth prospects of the Global Thin Film Metrology Systems market for the period 2015-2019. It considers 2014 as the base year and provides data for the trailing 12 months. To calculate the market size, the report considers revenue generated from the sales of thin film metrology systems to various end-users including:
• ODMs
• OEMs
• Foundries

[Key Regions]
• Americas
• APAC
• EMEA

[Key Vendors]
• KLA-Tencor
• Nanometrics
• Nova Measuring Instruments
• Rudolph Technologies

[Other Prominent Vendors]
• Hitachi High-Technologies
• SCREEN Holdings
• Semilab

[Market Driver]
• Increased Level of Complexity in ICs
• For a full, detailed list, view our report

[Market Challenge]
• Cyclic Nature of Semiconductor Industry
• For a full, detailed list, view our report

[Market Trend]
• Increasing Demand for Integration and Miniaturization of Semiconductor Devices
• For a full, detailed list, view our report

[Key Questions Answered in this Report]
• What will the market size be in 2019 and what will the growth rate be?
• What are the key market trends?
• What is driving this market?
• What are the challenges to market growth?
• Who are the key vendors in this market space?
• What are the market opportunities and threats faced by the key vendors?
• What are the strengths and weaknesses of the key vendors?

【資料の目次】

01. Executive Summary

02.List of Abbreviations

03.Scope of the Report
03.1 Market Overview
03.2 Product Offerings

04.Market Research Methodology
04.1 Market Research Process
04.2 Research Methodology

05.Introduction

06.Market Landscape
06.1 Market Size and Forecast
06.2 Five Forces Analysis

07.Geographical Segmentation
07.1 Global Thin Film Metrology Systems Market by Geography

08.Buying Criteria

09.Market Growth Drivers

10.Drivers and their Impact

11.Market Challenges

12.Impact of Drivers and Challenges

13.Market Trends

14.Trends and their Impact

15.Vendor Landscape
15.1 Competitive Scenario
15.2 Market Share Analysis 2013
15.3 Other Prominent Vendors
15.3.1 SCREEN Holdings
15.3.2 Semilab
15.3.3 Hitachi High-Technologies

16.Key Vendor Analysis
16.1 KLA-Tencor
16.1.1 Key Facts
16.1.2 Business Overview
16.1.3 Product Segmentation
16.1.4 Services Offered
16.1.5 Geographical Segmentation by Revenue 2014
16.1.6 SWOT Analysis
16.2 Nanometrics
16.2.1 Key Facts
16.2.2 Business Overview
16.2.3 Business Segmentation by Revenue 2013
16.2.4 Business Segmentation by Revenue 2012 and 2013
16.2.5 Geographical Segmentation by Revenue 2013
16.2.6 Business Strategy
16.2.7 Recent Developments
16.2.8 SWOT Analysis
16.3 Nova Measuring Instruments
16.3.1 Key Facts
16.3.2 Business Overview
16.3.3 Product Segmentation
16.3.4 Geographical Segmentation by Revenue 2013
16.3.5 Business Strategy
16.3.6 Key Developments
16.3.7 SWOT Analysis
16.4 Rudolph Technologies
16.4.1 Key Facts
16.4.2 Business Overview
16.4.3 Business Segmentation by Revenue 2013
16.4.4 Business Segmentation by Revenue 2012 and 2013
16.4.5 Geographical Segmentation by Revenue 2013
16.4.6 Business Strategy
16.4.7 Recent Developments
16.4.8 SWOT Analysis

17.Other Reports in this Series

[List of Exhibits]

Exhibit 1: Market Research Methodology
Exhibit 2: Semiconductor Value Chain
Exhibit 3: Global Thin Film Metrology Systems Market (US$ million)
Exhibit 4: Global Thin Film Metrology Systems Market by Geography 2014-2019 (CAGR)
Exhibit 5: Global Thin Film Metrology Systems Market by Geography 2014-2019
Exhibit 6: Global Thin Film Metrology Systems Market by Geography 2014-2019 (US$ million)
Exhibit 7: Global Thin Film Metrology Systems Market by Vendor Segmentation 2014
Exhibit 8: KLA-Tencor: Product Segmentation
Exhibit 9: KLA-Tencor: Services Offered
Exhibit 10: KLA-Tencor: Geographical Segmentation by Revenue 2014
Exhibit 11: Nanometrics: Business Segmentation by Revenue 2013
Exhibit 12: Nanometrics: Business Segmentation by Revenue 2012 and 2013 (US$ billion)
Exhibit 13: Nanometrics: Geographical Segmentation by Revenue 2013
Exhibit 14: Nova Measuring Instruments: Product Segmentation 2013
Exhibit 15: Nova Measuring Instruments: Geographical Segmentation by Revenue 2013
Exhibit 16: Rudolph Technologies: Business Segmentation by Revenue 2013
Exhibit 17: Rudolph Technologies: Business Segmentation by Revenue 2012 and 2013(US$ million)
Exhibit 18: Rudolph Technologies: Geographical Segmentation by Revenue 2013



【掲載企業】

KLA-Tencor , Nanometrics , Nova Measuring Instruments , Rudolph Technologies , Hitachi High-Technologies, SCREEN Holdings, Semilab

【資料のキーワード】

薄膜計測装置、膜厚測定、技術、プロフィロメトリー、偏光解析法、リフレクトメトリ、X線分析

【調査方法】

一次資料による調査(業界専門家、ベンダー、代理店、顧客等を対象にしたデプスインタビュー調査など)及び二次資料による調査(Technavio独自のプラットフォーム、産業書籍、企業報告書、ニュース記事、アナリストレポート、貿易協会、政府機関発行データなど)

★調査レポート[薄膜計測装置の世界市場2015-2019] (Global Thin Film Metrology Systems Market 2015-2019 / IRTNTR5173)販売に関する免責事項
[薄膜計測装置の世界市場2015-2019] (Global Thin Film Metrology Systems Market 2015-2019 / IRTNTR5173)についてEメールでお問い合わせ


◆H&Iグローバルリサーチ株式会社のお客様(例)◆